PD-QE New Type Photodetector Characterization Analyzer

The PD-QE system is capable of measuring the relevant characteristics of third-generation semiconductor materials in Photodiodes/Photodetectors:

  1. External Quantum Efficiency (EQE) Spectral Measurement
  2. Spectral Response Measurement
  3. I-V Curve Measurement
  4. I-V Curve Measurement at Different Light Intensities
  5. Fixed Current/Voltage and Time-Varying Voltage/Current Testing
  6. NEP (Noise Equivalent Power) Spectral Measurement
  7. D* (Detectivity) Spectral Measurement
  8. Noise-Current-Frequency Response (A/Hz^-1/2; 0.01Hz~1000Hz)
  9. Flicker Noise, Johnson Noise, Shot Noise Analysis

 

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Description

Traditional quantum efficiency systems face several challenges when it comes to testing new types of photodetectors:

  1. Voltage Limitation: Traditional quantum efficiency systems use lock-in amplifiers that have a limited tolerance for DC voltages. As a result, the bias voltage applied in conventional systems cannot exceed 12V.
  2. Noise Frequency Analysis: Traditional systems lack the capability to perform noise frequency analysis, which is crucial for understanding the performance characteristics of modern photodetectors.
  3. Direct Measurement of NEP and D*: Traditional systems are unable to directly measure Noise Equivalent Power (NEP) and Detectivity (D*) parameters, which are important for evaluating the sensitivity and performance of photodetectors.

To address these challenges, OptoFlame Technologies offers a comprehensive solution called PD-QE, specifically designed for the testing and characterization of next-generation photodetectors (PD).

 

 

Application

Application Areas
  •  OPD, Organic Photodiode
  • QDPD, Quantum Dots Photodiode
  • PPD, Perovskite Photodiode
  • New Material Photodetectors

 


 

Detectable Parameters

Detectable Parameters
External Quantum Efficiency (EQE) Spectrum Measurement
Spectral Response Measurement
I-V Curve Measurement

Measurement of I-V curves at different light intensities

Measurement of I-V curves with fixed current/voltage and time-varying voltage/current

NEP (Noise Equivalent Power) Spectrum Measurement
D* (Detectivity) Spectrum Measurement
Noise-current-frequency (A/Hz-1/2; 0.01Hz~1000Hz)
Flicker noise, Johnson Noise, Shot noise Analysis

 


NEP/D*

PD-QE allows for direct detection and plotting of frequency noise for the device.

 

PD-QE integrates with multiple SMU (Source Measurement Unit) controllers

Including those produced by Keithley and Keysight, to perform various IV curve measurements.

Users do not need to search for or integrate IV curve testing separately. The figure shows the IV curves of different samples tested using PD-QE, with the ability to display multiple plots simultaneously.

 

Noise Current Spectrum Plot

Specifications

Specifications
Light Source and Beam Delivery System High Stability Xe Light Source
High-efficiency, high-reflectivity ellipsoidal reflector collection system
Automatic filter wheel system
Stable power supply
Light source instability < 1%
Lamp source timer
Single-color light module: wavelength range 300-1100 nm
Spot coupling module: Spot size: 1×1 mm².
Optical Power Calibration Module Optical power detector Si
Wavelength range: 300-1100nm
Traceable report available, traceable to NIST.
Manual Light Intensity Modulation Kit (MLDR) Multiple optical attenuating filters attached for your reference
Including a filter holder
The filter holder is compatible with the light energy calibration module and can be customized to accommodate different sample holders.
iDB (Masked Dark Box) Integrated Anti-stray Light Enclosure
C-IPC Controller Industrial Computer (including monitor, keyboard, and mouse)
Product Dimensions Load Capacity: 200 kg Tabletop Dimensions: 1200mm (L) x 1000mm (W) Equipment Dimensions: 620mm (L) x 620mm (W) x 725mm (H)
Equipment Weight: 80 kg

 


 

Spot Specifications

Stability of Light Source: Less than 1% instability

Monochromatic Light Module: Wavelength Range of 300~1100 nm

Beam Coupling Module: Spot Size of 1×1 mm²

Optional: EQE extension to near-infrared wavelength up to 1800 nm

Softwear

On the new software platform SW-XQE, it offers convenient expandability, allowing for testing standard EQE measurements as well as integration with multiple SMUs for IV curve characterization. It also provides various analysis functionalities, including D*, NEP, and frequency noise plots.

Measurement Software Features Absolute Intensity Calibration
Spectral Response Measurement
External Quantum Efficiency Measurement (EQE)
Dark IV Measurement, J0 Analysis
NEP Spectrum
D* Spectrum
Noise-current-frequency Response graph (A/Hz-1/2)
Flicker noise, Johnson Noise, Shot noise Analysis
I-V Curve Measurement

Measurement of Current-Voltage (I-V) curves

Measurement of Voltage-Current (V-I) curves over time

Under illumination conditions

Independent control of the overall hardware system and data acquisition

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Optional Features

Optional Optional Features
High-Precision Voltage and Current Source

Fourier Transform (FFT) Measurement Module

Current resolution of 1E-12 Amperes

Voltage source of ±20V

>4,500 reads/s

Equipped with FTM (Fast Fourier Transform) package with Co-axial connectors for FFT analysis

Noise-current frequency up to 5kHz

High-precision voltage source and current source

Fourier Transform (FFT) measurement module (2)

  • Current resolution: 1E-14 Amperes
  • Voltage range: ±200 Volts
  • Reading rate: > 4,500 reads per second
  • FTM (Fast Fourier Transform) package with Co-axial connectors for FFT analysis
  • Noise-current frequency up to 20 kHz

Sample stage

 

XYZ-axis displacement platform
Extension of EQE to near-infrared wavelengths Measurement wavelength extension to 300-1800nm (extended up to 1800nm)

Standard Ge (Germanium) detector and connecting cable

Extended wavelength range from 800-1800nm

Includes calibration report

Expanded long-wavelength spectral software measurement capabilities

 

System Design

PD-QE 新型光電感測器特性分析儀 外觀尺寸圖

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