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SG-A _ CMOS Image Sensor Tester

The SG-A system is the world’s first commercial CMOS Image sensor tester.
It can perform the following parameter measurements on image sensor chips:

  1. Quantum efficiency
  2. Overall system gain
  3. Temporal dark noise
  4. Signal-to–noise ratio
  5. Absolute sensitivity threshold
  6. Saturation capacity
  7. Dynamic range
  8. Spatial nonuniformity (DSNU, PRNU)
  9. Linearity error
  10. CRA


Rapid installation and rapid deployment can help you accelerate time to market
The first commercial-grade integrated image sensor tester

The SG-A system is the world’s first commercial CMOS Image sensor tester.

SG-A can provide the most comprehensive CMOS image sensor parameter characterizations, such as full-spectrum quantum efficiency QE, overall system gain K, temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, Linearity error, and chief-ray angle CRA.

   The device under test can be several type of CMOS image sensor modules. The inspection procedures are complied with the EMVA 1288 standard.

Therefore, SG-A CMOS image sensor tester can be used to do wafer-level optics inspection, processing parameters controlling, micro-lens design, micro-lens verification. The highly collimated beam (< 1°) of the SG-A CMOS image sensor tester can overcome the inspection difficulties of new manufacturing processes that traditional optical systems (such as integrating sphere systems) cannot solve.

The processes include small pixel   (< 1 um), BSI and 3D stacking, micro lens, new Bayer array design, and so on.

The SG-A system developed by Enlitech has the following features:

  • non-destructive optical inspection.
  • High collimated beam angle; <0.05°, <0.1°, <0.5°, <1°, <3°(different models).
  • High Uniform Beam spot: ≥ 99%.
  • Light instability ≤ 1%.
  • High dynamic range testing capability: 80dB~140dB (different models).
  • Can test CMOS image sensor parameters: Quantum efficiency, Spectral Response, System Gain, Sensitivity, Dynamic Range, Dark Current/Noise, SNR, Saturation Capacity, Linearity Error (LE), DCNU (Dark Current Non-Uniformity), PRNU (Photo Response Non-Uniformity), CRA (Chief Ray Angle).
  • Full Spectrum wavelength range: 300nm-1100nm or 350nm~1000nm (PTC).
  • Wavelength can be extended to 1700nm or more.
  • DUT package: CIS module, PCB Board level, CIS Camera, with/without micro-lens.
  • “Direct” or “Handshake” communication protocol between SG-A and DUT.
  • Customized test fixture and stages (manual or automatic, max 6-axises).
  • Powerful analyzing software ARGUS®.
  • Application: fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor) micro-lens design of CIS, wafer level optics inspection, CIS DSP chip algorithm development, Si TFT sensor panel, Time-of-Flight camera sensor, Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,),d-ToF sensor, i-ToF sensor, Multi-spectral sensor, Ambient light sensor (ALS), Fingerprint-Under-Display (FoD) sensor.

Introducing SG-A: A Revolutionary CIS Optical Testing Instrument for Enhanced Performance

The SG-A incorporates a modular and integrated design, offering numerous advantages that save valuable time and reduce trial-and-error costs. For semiconductor engineers, this design approach provides unparalleled flexibility and customization capabilities, enabling rapid identification and resolution of production issues. Furthermore, this design approach minimizes risks and uncertainties during the manufacturing process, enhancing efficiency and product quality.

Modular and integrated design facilitates faster time-to-market for customers due to its customizability, allowing quick adjustments and improvements based on specific customer needs and requirements. This capability significantly reduces customers’ R&D costs and time, enabling them to deliver customized products to the market faster, thereby enhancing their market competitiveness.

SG-A not only complies with international standards such as the EMVA1288 standard but also meets the ISO 17025 standard for overall system calibration. This ensures that the testing results are traceable to the international SI (System International) base units, enabling international comparability. This provides our esteemed customers with unparalleled credibility and stability.

SG-A enables comprehensive assessment and analysis of CIS (Complementary Metal-Oxide-Semiconductor) products in various manufacturing stages, including wafers, chips, and modules. This advanced optical inspection method provides semiconductor engineers with an efficient and precise testing approach. It not only allows testing without damaging the product but also offers deep insights into the performance of CIS products, facilitating quality improvements.

Furthermore, optical inspection technology offers several advantages such as high throughput, reliability, and efficiency, providing crucial testing support at each stage of CIS product manufacturing.

SG-A, paired with the powerful analysis software ARGUS®, provides you with comprehensive testing capabilities for CIS image sensors’ performance parameters, allowing you to explore the full-spectrum quantum efficiency and study the sensor’s response at different wavelengths. This comprehensive understanding enables you to optimize the sensor’s performance, ensuring optimal sensitivity and capturing stunning images.

Another advantage of SG-A and ARGUS® is spectral response analysis. You can evaluate the sensor’s response to different wavelengths, allowing you to optimize its performance in specific lighting conditions and applications. Such optimization can achieve unparalleled color accuracy and fidelity.

System gain evaluation is crucial for obtaining high-quality images and minimizing noise. SG-A and ARGUS® can precisely measure and analyze the sensor’s gain characteristics, enabling you to enhance image quality, especially in low-light environments, for sharper and more vibrant images.

Sensitivity analysis provided by SG-A and ARGUS® allows you to assess the sensor’s ability to capture fine details and variations in light intensity. By optimizing sensitivity, you can push the limits of image quality, ensuring each photo has outstanding clarity and definition.

Dynamic range evaluation is essential for capturing scenes with large variations in brightness. SG-A and ARGUS® enable you to analyze the sensor’s dynamic range capability, ensuring the retention of details in both highlight and shadow areas. This optimization allows your images to have excellent tonal range and balanced exposure.

Dark noise evaluation is crucial for reducing unnecessary noise and image artifacts in low-light conditions. SG-A and ARGUS® provide detailed dark noise analysis, allowing you to optimize denoising algorithms and obtain clear, noise-free images even in challenging lighting conditions.

Signal-to-noise ratio (SNR) analysis provided by SG-A and ARGUS® allows you to evaluate the quality of images by quantifying the ratio between the desired signal and unwanted noise. By maximizing the SNR, you can obtain clear images, reduce noise artifacts, and enhance overall image fidelity.

Saturation capacity analysis is vital for understanding the sensor’s ability to capture and reproduce colors at their limits. Through SG-A and ARGUS®, you can evaluate the sensor’s saturation capacity, ensuring vivid and true-to-life colors even under the most challenging lighting conditions.

Linear error (LE) evaluation helps understand the accuracy of the sensor’s response to linearly increasing light intensity. By analyzing and minimizing linear error, you can achieve consistent and accurate exposure, ensuring faithful reproduction of scenes with precise color gradients.

SG-A and ARGUS® also support the evaluation of dark current non-uniformity (DCNU) and photoresponse non-uniformity (PRNU). These analyses provide insights into the sensor’s uniformity, allowing you to identify and mitigate any non-uniformity issues, achieving more consistent and reliable performance.

Additionally, SG-A can also measure the chief ray angle (CRA), which determines the angle at which the chief ray enters the sensor. By accurately assessing the CRA, you can ensure optimal light collection, greatly enhancing image sharpness and quality.

SG-A and ARGUS® provide a comprehensive solution for testing and analyzing CIS image sensors, offering valuable data and insights to enhance product performance and achieve exceptional image quality. Step into this cutting-edge technology and let SG-A and ARGUS® propel your CIS sensor production to new heights.

SG-A Testing and Validation

Sga CMOS影像晶片(CIS)測試

The SG-A system features an excellent optical system design, which utilizes non-destructive optical modulation techniques to reverse-translate digital image signals into analog signal characteristics. It enables the measurement of various parameters such as quantum efficiency, spectral response, system gain, dynamic range, dark current noise, SNR, saturation capacity, linearity error (LE), dark current non-uniformity (DNU), photoresponse non-uniformity (PRNU), and chief ray angle (CRA).

The testing data is as follows:


SG-A 測試數據

SG-A 測試數據

SG-A 測試數據

TFT 影像模組開發驗證(FoD)

As full-screen smartphone designs have become mainstream, optical under-display fingerprint recognition has also gained significant market attention. Among them, the development of TFT under-display image recognition modules has become a fiercely contested area for display manufacturers and display driver chip developers. SG-A adopts non-destructive optical inspection technology, which enables rapid detection of various crucial parameters of TFT image modules, such as full-spectrum quantum efficiency testing, without the need for destructive sample preparation. This accelerates the overall product design and verification




Fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor) Micro-lens design of CIS, wafer level optics inspection
CIS DSP chip algorithm development Si TFT sensor panel
Time-of-Flight camera sensor Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,)
d-ToF sensor, i-ToF sensor Multi-spectral sensor
Ambient light sensor (ALS) Fingerprint-Under-Display (FoD) sensor

Can test CMOS image sensor parameters

Can test CMOS image sensor parameters
Quantum efficiency Spatial nonuniformity (DSNU, PRNU)
Overall system gain Linearity error
Temporal dark noise CRA
Signal-to–noise ratio Saturation capacity
Absolute sensitivity threshold Dynamic range




Quantum Efficiency Testing System








Standard configuration with Qth light source (optional 75W Xenon lamp white light source)
Elliptical Collimating Optical System
Stable Power Supply
Full Spectrum Wavelength Range: 300-1100 nm or 350-1700 nm Single

Wavelength Light Source: 470nm, 530nm, 630nm, 940nm (±5nm) or custom-made (PTC) Monochromatic

Light Module: Wavelength range of 350-1100 nm, Wavelength resolution of 0.1nm, with a typical bandwidth of 10nm Wavelength accuracy of 0.6nm

Dynamic Range: 80dB、100dB or 140dB
Fiber-Coupled Uniform Light Module (SG-A-i-QE-CU401001-S solution)
Fiber-Coupled Uniform Illumination Module Uniform Illumination Area 10×10mm,>99%
Working Distance Distance from Emission Port > 20cm
Maximum Luminous Intensity of Monochromatic Light 25 μW/cm2
15 μW/cm2
10 μW/cm2
Light Source Instability <1%
Collimation Angle < 3°
< 1°
High Average Quantum Efficiency Testing System (SG-A-QE-RU502001-S Solution)
High Average Quantum Efficiency Testing System Uniform Illumination Area 10×10mm,>99%
Working Distance Distance from Emission Port > 20cm
Maximum Luminous Intensity of Monochromatic Light 8 μW/cm2
5 μW/cm2
2 μW/cm2
470 nm
530 nm
630 nm
Light Source Instability 1%
Collimation Angle < 3°
< 1°
Ø 50*50mm
Ø 10*10mm
System Controller Compatible with PCI, USB, RJ45, RS232, and other communication interfaces

Irradiance Calibration Module



Camera Sample Stage
  • Calibration/Test Manual Adjustment Switch
  • Adjustment Precision: 10 μm
  • Compatible with Maximum Sample Size: 80 mm x 80 mm x 45 mm (thickness)
  • Maximum Load Capacity: 5 kg
Automated CRA Testing Module
  • CRA Testing Software
  • Maximum Sample Size: 80 mm x 80 mm x 45 mm (thickness) Load Capacity: 3 kg
  • Computer-Controlled Rotating Sample Stage
  • Rotation Angle Range: ±80
  • degrees Rotation Resolution: 0.01 degrees
  • Automatic XY Axis Displacement Control
  • Calibration/Test Position Fast Positioning Switch Displacement
  • Distance: ±50 mm Displacement
  • Precision: 2 μm Z-Axis
  • Displacement Control (Manual Control)
  • Displacement Distance: ±6 mm
  • Displacement Precision: 10 μm
Darkroom Dimensions: 1000 mm x 900 mm x 1400 mm (with 10% clearance space)

Full-Wavelength High Dynamic Range Light Intensity Variation Function


  • Automatic Linear Light Intensity Adjuster
  • Continuous Fine Adjustment of Light Intensity
  • Light Intensity Control Range: 0-100%
  • Scanning Accuracy: 0.1%
  • Repeatability Accuracy: Better than 3%
  • Automatic Control

Dimensional Diagram/Architecture