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SPD2200 Commercial-grade SPAD single photon avalanche diode efficiency integrated tester

Full-spectrum performance parameter testing and analysis:

  • SR, Spectral Responsivity
  • EQE, External Quantum Efficiency
  • PDP, Photon Detection Probability
  • DCR, Dark Count Rate
  • BDV, Break-Down Voltage

Jitter Afterpulsing probability Diffusion tailSNR:

  • Jitter
  • Afterpulsing probability
  • Diffusion tail
  • SNR


The SPD2200 integrates advanced optical and electrical systems, coupled with the extensive experience of OptoFire in sensor testing and analysis. It provides a comprehensive and user-friendly software control interface and analysis functions. By utilizing the SPD2200, you can save time and costs associated with system setup while reducing uncertainties in test results. This accelerates product development cycles and enhances competitiveness.

The SPD2200, a novel characterization device for single photon detectors, offers the advantage of direct integration of optical and electrical systems, resulting in a compact form factor. It can be rapidly deployed on the production lines of original manufacturers, and the synergy between software and hardware effectively reduces RD costs during SPAD development. Furthermore, it significantly minimizes uncertainties in test results, leading to improved yields. In the competitive race among various manufacturers to develop SPAD chips for LiDAR applications, the SPD2200 has become a critical research instrument.

SPD2200 Proof

The Dark Count vs. Bias Voltage graph


The PDE (Photon Detection Efficiency) spectrum of an SPAD (Single-Photon Avalanche Diode) at different voltages


The relationship between SPAD (Single-Photon Avalanche Diode) dark count and breakdown voltage


SPAD jitter measurement


Differences between SPD2200 integration and researchers' self-assembled measurement setups

The SPD2200 from PhotonFire Technology integrates all the necessary hardware and software for measurements into an all-in-one device. In comparison to the traditional approach where researchers manually assemble measurement setups on an optical table, the SPD2200 offers improved spatial utilization. It provides better protection for high-precision measurement equipment components, resulting in more accurate measurements.

By consolidating all the required components into a single integrated device, the SPD2200 optimizes the use of space and ensures a more efficient and streamlined measurement process. This integrated design also enhances the overall precision of the measurements conducted.

Integrated measurement device

SPD2200 外觀

Custom-built measurement system by traditional researchers

optical table

Application Field

The newly developed SPD2200 by Enlitech is the world’s first commercial-grade characterization system for single photon detectors (SPDs).

It can be used to test and analyze the characteristics of single photon avalanche diodes (SPADs), a key component in LiDARs (Light Detection and Ranging). The SPD2200 meets customers’ needs for measuring various parameters during the development of dToF modules.

The SPD2200 has two modules: (1) Spectral Characterization Module (SDTM) and (2) Time Domain Characterization Module (TDTM). Customers can choose to purchase either module for different measurement scenarios, or use both modules together for comprehensive characterization.

Measurable Parameters

Measurable Parameters

Spectral Performance Test Analysis of SPAD Single Photon Discrimination Characteristics
Spectral Responsivity(SR) Timing jitter
External Quantum Efficiency(EQE) Afterpulsing probability
Photon Detection Probability(PDP) Diffusion Tail
Dark Count Rate(DCR) SNR
Break-Down Voltage(BDV)

SDTM、TDTM Characterization Module

(1) SDTM Spectral Characterization Module – Equipment Specifications

SDTM Spectral Characterization Module – Equipment Specifications


Continuous wave light source
  1. Stable light source system (xenon lamp)
  2. Monochromator: 350-1100 nm, resolution 1nm, typical FWHM 10 nm; accuracy 0.6nm
  3. Fiber coupling and optical diffuser: 5×5 mm or 10×10 mm beam, uniformity >99% at 25 mm working distance. (with 50 mm x 50 mm illumination spot)
Light source and beam delivery system
  1. Ultra-uniform silicon photodiode sensor, 10mm x 10mm active area, optically aged to eliminate instability
  2. Wavelength range 350-1100nm, peak responsivity at 960nm
  3. Traceable, certified calibration report to NIST (ISO 17025 certified, compliant to Spec 1)
  4. Noise equivalent power of 1.5 x 10-14 W/√Hz
Source stage
  1. Device biasing and measurement
  2. Voltage range: > 200V
  3. Current range: 1.5A max.
  4. Minimum resolution: 100 nV, 10 fA
Photon detector
  1. Resolution: 100 ps
  2. Count rate: > 300 MHz
  3. Input voltage range: ± 5V
Measurable parameters
  1. Photon detection probability over spectrum
  2. Dark counts
  3. External quantum efficiency over spectrum
  4. Breakdown voltage
  5. Spectral responsivity over spectrum

(2) TDTM Time Domain Characterization Module

TDTM Time Domain Characterization Module
PS Laser
  1. Wavelength 940 nm
  2. FWHM <90 ps
  3. MAX rep. rate: 80 MHz (adjustable)
  1. Detection Channel: 4 Chs
  2. BIN Resolution: 5 ps
  3. Time-tagging and time-resolved modes
Measurable Parameters
  1. Jitter
  2. Diffusion Tail
  3. Signal-to-Noise Ratio
  • Industrial Computer
  • Screen
  • Keyboard and Mouse

Optional items

Optional items Probe station
  1. Three styles: fully automatic / semi-automatic / manual
  2. Suitable for wafer level sample measurement
  3. Please contact us
Customized test fixture
  1. Suitable for module type sample measurement
  2. Please contact us
Custom camera obscura
  1. The camera obscura has a noise shielding function
  2. Please contact us