PD-QE New Type Photodetector Characterization Analyzer

Description

Traditional quantum efficiency systems face several challenges when it comes to testing new types of photodetectors:

Voltage Limitation: Traditional quantum efficiency systems use lock-in amplifiers that have a limited tolerance for DC voltages. As a result, the bias voltage applied in conventional systems cannot exceed 12V.
Noise Frequency Analysis: Traditional systems lack the capability to perform noise frequency analysis, which is crucial for understanding the performance characteristics of modern photodetectors.
Direct Measurement of NEP and D*: Traditional systems are unable to directly measure Noise Equivalent Power (NEP) and Detectivity (D*) parameters, which are important for evaluating the sensitivity and performance of photodetectors.

To address these challenges, OptoFlame Technologies offers a comprehensive solution called PD-QE, specifically designed for the testing and characterization of next-generation photodetectors (PD).

Application

Application Areas
OPD, Organic Photodiode	QDPD, Quantum Dots Photodiode
PPD, Perovskite Photodiode	New Material Photodetectors

Detectable Parameters

Detectable Parameters
External Quantum Efficiency (EQE) Spectrum Measurement
Spectral Response Measurement
I-V Curve Measurement Measurement of I-V curves at different light intensities Measurement of I-V curves with fixed current/voltage and time-varying voltage/current
NEP (Noise Equivalent Power) Spectrum Measurement
D* (Detectivity) Spectrum Measurement
Noise-current-frequency (A/Hz-1/2; 0.01Hz~1000Hz)
Flicker noise, Johnson Noise, Shot noise Analysis

NEP/D*

PD-QE allows for direct detection and plotting of frequency noise for the device.

PD-QE integrates with multiple SMU (Source Measurement Unit) controllers

Including those produced by Keithley and Keysight, to perform various IV curve measurements.

Users do not need to search for or integrate IV curve testing separately. The figure shows the IV curves of different samples tested using PD-QE, with the ability to display multiple plots simultaneously.

Noise Current Spectrum Plot

Specifications

Specifications
Light Source and Beam Delivery System	High Stability Xe Light Source
	High-efficiency, high-reflectivity ellipsoidal reflector collection system
	Automatic filter wheel system
	Stable power supply
	Light source instability < 1%
	Lamp source timer
	Single-color light module: wavelength range 300-1100 nm
	Spot coupling module: Spot size: 1×1 mm².
Optical Power Calibration Module	Optical power detector Si
	Wavelength range: 300-1100nm
	Traceable report available, traceable to NIST.
Manual Light Intensity Modulation Kit (MLDR)	Multiple optical attenuating filters attached for your reference
	Including a filter holder
	The filter holder is compatible with the light energy calibration module and can be customized to accommodate different sample holders.
iDB (Masked Dark Box)	Integrated Anti-stray Light Enclosure
C-IPC Controller	Industrial Computer (including monitor, keyboard, and mouse)
Product Dimensions	Load Capacity: 200 kg Tabletop Dimensions: 1200mm (L) x 1000mm (W) Equipment Dimensions: 620mm (L) x 620mm (W) x 725mm (H) Equipment Weight: 80 kg

Spot Specifications

Stability of Light Source: Less than 1% instability

Monochromatic Light Module: Wavelength Range of 300~1100 nm

Beam Coupling Module: Spot Size of 1×1 mm²

Optional: EQE extension to near-infrared wavelength up to 1800 nm

Softwear

On the new software platform SW-XQE, it offers convenient expandability, allowing for testing standard EQE measurements as well as integration with multiple SMUs for IV curve characterization. It also provides various analysis functionalities, including D*, NEP, and frequency noise plots.

Measurement Software Features	Absolute Intensity Calibration
	Spectral Response Measurement
	External Quantum Efficiency Measurement (EQE)
	Dark IV Measurement, J0 Analysis
	NEP Spectrum
	D* Spectrum
	Noise-current-frequency Response graph (A/Hz-1/2)
	Flicker noise, Johnson Noise, Shot noise Analysis
	I-V Curve Measurement Measurement of Current-Voltage (I-V) curves Measurement of Voltage-Current (V-I) curves over time Under illumination conditions Independent control of the overall hardware system and data acquisition
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Optional Features

Optional	Optional Features
High-Precision Voltage and Current Source Fourier Transform (FFT) Measurement Module	Current resolution of 1E-12 Amperes Voltage source of ±20V >4,500 reads/s Equipped with FTM (Fast Fourier Transform) package with Co-axial connectors for FFT analysis Noise-current frequency up to 5kHz
High-precision voltage source and current source Fourier Transform (FFT) measurement module (2)	Current resolution: 1E-14 Amperes Voltage range: ±200 Volts Reading rate: > 4,500 reads per second FTM (Fast Fourier Transform) package with Co-axial connectors for FFT analysis Noise-current frequency up to 20 kHz
Sample stage	XYZ-axis displacement platform
Extension of EQE to near-infrared wavelengths	Measurement wavelength extension to 300-1800nm (extended up to 1800nm) Standard Ge (Germanium) detector and connecting cable Extended wavelength range from 800-1800nm Includes calibration report Expanded long-wavelength spectral software measurement capabilities